Analytical electron microscopic studies and positron lifetime measurements in Al-doped MgO crystals
- 15 July 1987
- journal article
- Published by AIP Publishing in Journal of Applied Physics
- Vol. 62 (2), 429-433
- https://doi.org/10.1063/1.339816
Abstract
MgO crystals intentionally doped with Al were characterized by analytical electron microscopic examinations and positron lifetime measurements. Large spinel (MgO Al2O3) precipitates were observed in samples with high contents of Al. A well-defined crystallographic relationship between the precipitates and the matrix was found. The characteristics of positron lifetime spectra appear to depend on the valence state of the different impurities in the MgO lattice suggesting that positrons are trapped by vacancy impurity complexes.Keywords
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