Effect of localized states on the current-voltage characteristics of metal-semiconductor contacts with thin interfacial layer
- 31 October 1994
- journal article
- Published by Elsevier in Solid-State Electronics
- Vol. 37 (10), 1759-1762
- https://doi.org/10.1016/0038-1101(94)90223-2
Abstract
No abstract availableKeywords
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