Tips for scanning tunneling microscopy produced by electron-beam-induced deposition
- 1 July 1992
- journal article
- Published by Elsevier in Ultramicroscopy
- Vol. 42-44, 1519-1525
- https://doi.org/10.1016/0304-3991(92)90476-z
Abstract
No abstract availableKeywords
This publication has 3 references indexed in Scilit:
- New scanning tunneling microscopy tip for measuring surface topographyJournal of Vacuum Science & Technology A, 1990
- High-resolution electron-beam induced depositionJournal of Vacuum Science & Technology B, 1988
- New selective deposition technology by electron-beam induced surface reactionJournal of Vacuum Science & Technology B, 1986