Feasibility of ToF atom-probe analysis of silicon
- 2 February 1981
- journal article
- Published by Elsevier in Surface Science
- Vol. 103 (2-3), L139-L142
- https://doi.org/10.1016/0039-6028(81)90260-0
Abstract
No abstract availableThis publication has 6 references indexed in Scilit:
- Photoillumination effect on silicon field ion microscopyJournal of Vacuum Science and Technology, 1979
- ToF Atom-probe mass spectra of GaAsSurface Science, 1978
- Atom-probe field-ion microscopy of GaAs and GaPSurface Science, 1978
- Atom-probe fim studies of β-SiC whiskersSurface Science, 1978
- Field-ion microscopy of siliconSurface Science, 1975
- VAPOR-LIQUID-SOLID MECHANISM OF SINGLE CRYSTAL GROWTHApplied Physics Letters, 1964