Infrared Observation of Anomalous Patterns in Highly Doped Silicon
- 1 March 1963
- journal article
- Published by IOP Publishing in Japanese Journal of Applied Physics
- Vol. 2 (3)
- https://doi.org/10.1143/jjap.2.194
Abstract
No abstract availableThis publication has 2 references indexed in Scilit:
- Anomalous Etch Patterns in Highly Doped SiliconJapanese Journal of Applied Physics, 1963
- Direct Observation of Imperfections in Semiconductor Crystals by Anomalous Transmission of X RaysJournal of Applied Physics, 1962