Microstructural characterization of nanocomposite thin films of AgSiO2, AgZnO and AgSi
- 1 May 1994
- journal article
- Published by Elsevier BV in Materials Science and Engineering: A
- Vol. 179-180, 545-551
- https://doi.org/10.1016/0921-5093(94)90264-x
Abstract
No abstract availableKeywords
This publication has 2 references indexed in Scilit:
- The preparation of transmission electron microscope specimens from compound semiconductors by ion millingUltramicroscopy, 1987
- Local-field effects and effective-medium theory: A microscopic perspectiveAmerican Journal of Physics, 1982