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Characterization of multiple deep level systems in semiconductor junctions by admittance measurements
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Characterization of multiple deep level systems in semiconductor junctions by admittance measurements
Characterization of multiple deep level systems in semiconductor junctions by admittance measurements
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M. Beguwala
M. Beguwala
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C.R. Crowell
C.R. Crowell
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28 February 1974
journal article
Published by
Elsevier
in
Solid-State Electronics
Vol. 17
(2)
,
203-214
https://doi.org/10.1016/0038-1101(74)90068-9
Abstract
No abstract available
Keywords
ADMITTANCE
TRAPS
EQUATION
DIFFERENTIAL
SEMICONDUCTOR
CARRIER
LYING
ΡAC/ΨAC
DC/DΧ
C2/Ε
Cited by 39 articles