Proton backscattering as a technique for light ion surface interaction studies in CTR materials investigations
- 1 September 1974
- journal article
- Published by Elsevier in Journal of Nuclear Materials
- Vol. 53, 268-275
- https://doi.org/10.1016/0022-3115(74)90255-4
Abstract
No abstract availableThis publication has 8 references indexed in Scilit:
- Depth distribution of implanted helium and other low-z elements in metal films using proton backscatteringApplied Physics Letters, 1973
- Effect of channeling and irradiation temperature on the morphology of blisters in niobiumApplied Physics Letters, 1972
- Dimensional expansion and surface microstructure in helium-implanted erbium and erbium-hydride filmsJournal of Nuclear Materials, 1972
- Spatial distribution of ions incident on solid target as a function of instantaneous energyRadiation Effects, 1971
- Correlation of Hydrogen Evolution with Surface Blistering in Proton-Irradiated AluminumJournal of Applied Physics, 1971
- Trapping and re-emission of fast deuterium ions from nickel IIRadiation Effects, 1970
- On the Z-dependence of the stopping power at low energiesNuclear Instruments and Methods, 1968
- Radiation Blistering: Interferometric and Microscopic Observations of Oxides, Silicon, and MetalsJournal of Applied Physics, 1966