PTCDA film formation on Si(111):H-1×1 surface: total current spectroscopy monitoring
- 10 February 2000
- journal article
- Published by Elsevier in Surface Science
- Vol. 446 (3), 193-198
- https://doi.org/10.1016/s0039-6028(99)01143-7
Abstract
No abstract availableKeywords
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