Measurements and calculations of the valence band offsets of SiOx/ZnS(111) and SiOx/CdTe(111) heterojunctions
- 1 May 1998
- journal article
- Published by American Vacuum Society in Journal of Vacuum Science & Technology B: Microelectronics and Nanometer Structures
- Vol. 16 (3), 989-995
- https://doi.org/10.1116/1.590056
Abstract
No abstract availableKeywords
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