Proposed formula for electron inelastic mean free paths based on calculations for 31 materials
- 1 December 1987
- journal article
- editorial
- Published by Elsevier in Surface Science Letters
- Vol. 192 (1), L849-L857
- https://doi.org/10.1016/0167-2584(87)90829-2
Abstract
No abstract availableKeywords
This publication has 20 references indexed in Scilit:
- The energy dependence of electron inelastic mean free pathsSurface and Interface Analysis, 1987
- Recent developments in quantitative surface analysis by electron spectroscopyJournal of Vacuum Science & Technology A, 1986
- Calculations of electron inelastic mean free paths from experimental optical dataSurface and Interface Analysis, 1985
- Low-energy x-ray interaction coefficients: Photoabsorption, scattering, and reflectionAtomic Data and Nuclear Data Tables, 1982
- Is there a universal mean-free-path curve for electron inelastic scattering in solids?Journal of Electron Spectroscopy and Related Phenomena, 1981
- Optical constants from the far infrared to the x-ray region: Mg, Al, Cu, Ag, Au, Bi, C, and Al_2O_3Journal of the Optical Society of America, 1975
- Abstract: Electron escape depths in aluminumJournal of Vacuum Science and Technology, 1974
- Distinction between adsorbed monolayers and thicker layers in Auger electron spectroscopyJournal of Physics F: Metal Physics, 1973
- Ultrasoft-X-Ray Reflection, Refraction, and Production of Photoelectrons (100-1000-eV Region)Physical Review A, 1972
- Escape Depths of X-ray Excited ElectronsPhysica Scripta, 1972