Reliability Analysis of Multistate Device Networks

Abstract

The concept of disjoint dual (D-dual) is used for determining the reliability of complex networks composed of 3-state and/or 2-state devices. One need apply the D-dual successively twice for determining the reliability of 3-state device networks and networks with some 2-state and some 3-state devices. However, only one application is required for 2-state device networks. The method is relatively simple, computerizable, and gives a computationally economic reliability expression. There are illustrative examples.