Reliability Analysis of Multistate Device Networks
- 1 August 1978
- journal article
- Published by Institute of Electrical and Electronics Engineers (IEEE) in IEEE Transactions on Reliability
- Vol. R-27 (3), 233-236
- https://doi.org/10.1109/tr.1978.5220338
Abstract
The concept of disjoint dual (D-dual) is used for determining the reliability of complex networks composed of 3-state and/or 2-state devices. One need apply the D-dual successively twice for determining the reliability of 3-state device networks and networks with some 2-state and some 3-state devices. However, only one application is required for 2-state device networks. The method is relatively simple, computerizable, and gives a computationally economic reliability expression. There are illustrative examples.Keywords
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