Dielectric screening in inversion layers

Abstract

The authors have investigated the dielectric response of carriers in inversion layers in a MISFET. Particular attention has been paid to the Anderson-localized regime (where the carriers are localized by disorder) and the possible Wigner lattice. In the Anderson-localized regime, it is found that the long-wavelength dielectric function is given by a Thomas-Fermi function. The most interesting feature of the dielectric response of the two-dimensional Wigner lattice is that its static dielectric constant omega (Q to 0,0) to - infinity .