Abstract
A frequency-domain techique based on the measurement of scattering parameters has been described for the simultaneous measurement of complex permittivity ϵ* and permeability μ* in the millimeter region. The technique can be easily adapted for broad-band measurements. Results are given for teflon, plexiglas, fiberglass, and FGM-40, a magnetic absorber in the X band. Reflection and transmission error parameters corrections can be implemented to improve the accuracy.