Performance of a double crystal diffractometer with different channel-cut perfect Si crystals
- 1 March 2000
- journal article
- Published by Elsevier in Physica B: Condensed Matter
- Vol. 276-278, 124-125
- https://doi.org/10.1016/s0921-4526(99)01375-7
Abstract
No abstract availableThis publication has 3 references indexed in Scilit:
- Surface-Induced Parasitic Scattering in Bonse–Hart Double-Crystal DiffractometersJournal of Applied Crystallography, 1998
- Optimization of a Bonse–Hart Ultra-Small-Angle Neutron Scattering Facility by Elimination of the Rocking-Curve WingsJournal of Applied Crystallography, 1997
- TAILLESS X-RAY SINGLE-CRYSTAL REFLECTION CURVES OBTAINED BY MULTIPLE REFLECTIONApplied Physics Letters, 1965