Growth Mechanism in Atomic Layer Epitaxy (I) Re‐evaporation of Cd and Te from CdTe(111) Surfaces Monitored by Auger Electron Spectroscopy
- 1 July 1986
- journal article
- research article
- Published by Wiley in Crystal Research and Technology
- Vol. 21 (7), 841-851
- https://doi.org/10.1002/crat.2170210707
Abstract
No abstract availableKeywords
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