TEM observations on grain boundaries in sintered silicon
- 1 November 1979
- journal article
- research article
- Published by Taylor & Francis in Philosophical Magazine A
- Vol. 40 (5), 589-610
- https://doi.org/10.1080/01418617908234861
Abstract
Grain boundaries in silicon with a predetermined orientation have been prepared by the sintering of two single crystals. A combination of standard transmission electron microscopy and lattice imaging was used to investigate the Structure of the boundaries produced. Low–angle grain boundaries on {100} and {111} planes, and twin boundaries on {111} planes are discussed in detail.Keywords
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