Non-Gaussian range profiles in amorphous solids
- 23 April 1973
- journal article
- Published by Elsevier in Physics Letters A
- Vol. 43 (6), 477-478
- https://doi.org/10.1016/0375-9601(73)90001-7
Abstract
No abstract availableKeywords
This publication has 3 references indexed in Scilit:
- Determination of implantation profiles in solids by secondary ion mass spectrometryPhysics Letters A, 1972
- Heavy-ion range profiles and associated damage distributionsRadiation Effects, 1972
- On the reflection coefficient of keV heavy-ion beams from solid targetsRadiation Effects, 1971