The Effect of a Single Defective Mask Element on the Multiplex Advantage in Hadamard Transform Spectroscopy
- 1 February 1989
- journal article
- research article
- Published by SAGE Publications in Applied Spectroscopy
- Vol. 43 (2), 278-283
- https://doi.org/10.1366/0003702894203372
Abstract
The effect of a single defective mask element on the output signal-to-noise ratio (SNR) for a stationary-mask Hadamard transform (HT) spectrometer is investigated. The decrease in output-SNR from that of an HT spectrometer having a perfect mask is found to be dependent on the amount of energy impinging on the defective element. A method of compensating for the defective mask element is presented. The method is computationally inexpensive and can be fully automated.Keywords
This publication has 2 references indexed in Scilit:
- Multiplex advantage in Hadamard transform spectrometry utilizing solid-state encoding masks with uniform, bistable optical transmission defectsApplied Optics, 1987
- A Visible Near-Infrared Hadamard Transform Spectrometer Based on a Liquid Crystal Spatial Light Modulator Array: A New Approach in SpectrometryApplied Spectroscopy, 1987