Application of Fourier analysis to the X-ray diffraction pattern of filings of a face-centred cubic copper–silicon–manganese alloy
- 1 August 1970
- journal article
- Published by International Union of Crystallography (IUCr) in Journal of Applied Crystallography
- Vol. 3 (4), 211-213
- https://doi.org/10.1107/s0021889870006064