The Effect of an Electric Field on the Decay of Excess Carriers in Semiconductors
- 1 January 1960
- journal article
- Published by IOP Publishing in Proceedings of the Physical Society
- Vol. 75 (1), 157-161
- https://doi.org/10.1088/0370-1328/75/1/427
Abstract
No abstract availableThis publication has 1 reference indexed in Scilit:
- Sweep-out Effects in the Phase Shift Method of Carrier Lifetime MeasurementsProceedings of the Physical Society, 1958