AES depth profiling with N2+ ion sputtering
- 1 November 1976
- journal article
- Published by Elsevier in Physics Letters A
- Vol. 59 (1), 62-64
- https://doi.org/10.1016/0375-9601(76)90354-6
Abstract
No abstract availableThis publication has 4 references indexed in Scilit:
- Depth-profiling of Cu-Ni sandwich samples by secondary ion mass spectrometryApplied Physics A, 1975
- Effect of oxygen on the sputtering of aluminium targets bombarded with argon ionsInternational Journal of Mass Spectrometry and Ion Physics, 1973
- Methods of surface studies depending on inelastic scattering of electronsVacuum, 1972
- Controlled Sputtering of Metals by Low-Energy Hg IonsPhysical Review B, 1956