Finite-Size Effects in a CuMn Spin-Glass

Abstract

Using dc sputtering in an UHV system we have prepared multilayer samples of Cu:Mn-Si with Cu:Mn thicknesses, $L$, between 4 and 500 nm. The temperature of the peak in the dc magnetic susceptibility of these spin-glass samples shifts with $L$ as $\frac{(T_{g0\mathrm{}}-T_g)}{T_{g0\mathrm{}}}\approx L^{-0.75\mathrm{}\pm 0.06}$ over the whole range of sample thickness. These results are discussed in terms of finite-size scaling and the possible effects of the electron mean free path on the effective exchange interaction.