Spin-Polarized Scanning Electron Microscope for Magnetic Domain Observation
- 1 July 1985
- journal article
- Published by IOP Publishing in Japanese Journal of Applied Physics
- Vol. 24 (7A), L542
- https://doi.org/10.1143/jjap.24.l542
Abstract
Spatial resolution of magnetic domain images obtained with a spin-polarized scanning electron microscope has been improved to a level of 1 µm for an iron sample. This value has been primarily obtained by using a field emission gun.Keywords
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