Random phase measurement errors in digital speckle pattern interferometry
- 1 January 1997
- journal article
- Published by Elsevier in Optics and Lasers in Engineering
- Vol. 26 (2-3), 131-150
- https://doi.org/10.1016/0143-8166(95)00109-3
Abstract
No abstract availableThis publication has 9 references indexed in Scilit:
- Effect of intensity error correlation on the computed phase of phase-shifting interferometryJournal of the Optical Society of America A, 1990
- Speckle photography fringe analysis: assessment of current algorithmsApplied Optics, 1989
- Digital phase stepping speckle interferometryOptics Communications, 1986
- Averaging double-exposure speckle interferogramsOptics Letters, 1985
- Phase-shifting speckle interferometryApplied Optics, 1985
- Fringe scanning speckle-pattern interferometryApplied Optics, 1985
- Fringe formation in speckle photographyJournal of the Optical Society of America A, 1984
- Speckle-pattern intensity and phase: Second-order conditional statisticsJournal of the Optical Society of America, 1979
- Interferometric displacement measurement on scattering surfaces utilizing speckle effectJournal of Physics E: Scientific Instruments, 1970