Surface and bulk laser-damage statistics and the identification of intrinsic breakdown processes
- 1 September 1973
- journal article
- Published by Institute of Electrical and Electronics Engineers (IEEE) in IEEE Journal of Quantum Electronics
- Vol. 9 (9), 890-896
- https://doi.org/10.1109/jqe.1973.1077766
Abstract
No abstract availableThis publication has 22 references indexed in Scilit:
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