Chemically sensitive structure-imaging with a scanning transmission electron microscope
- 1 December 1988
- journal article
- letter
- Published by Springer Nature in Nature
- Vol. 336 (6199), 565-567
- https://doi.org/10.1038/336565a0
Abstract
No abstract availableKeywords
This publication has 9 references indexed in Scilit:
- Ordered-defect structure in epitaxialthin filmsPhysical Review B, 1988
- Structural characterization of Ba2YCu3O7 by high resolution transmission electron microscopyJournal of Electron Microscopy Technique, 1988
- Surface decomposition of superconducting YBa2Cu3O7Physica Status Solidi (a), 1988
- HREM Study of the Defects in the Orthorhombic Superconductor YBa 2 Cu 3 O 7±ε . II. - Oxygen Substoichiometry and Cationic DisorderEurophysics Letters, 1987
- Microstructure, oxygen ordering and planar defects in the high-Tc superconductor YBa2Cu3O6.9Nature, 1987
- Elemental mapping with elastically scattered electronsJournal of Microscopy, 1986
- Direct imaging of dopant distributions in silicon by scanning transmission electron microscopyApplied Physics Letters, 1984
- Zur Kleinwinkeltheorie der VielfachstreuungZeitschrift für Naturforschung A, 1960
- The Theoretical Resolution Limit of the Electron MicroscopeJournal of Applied Physics, 1949