Reflected‐light differential‐interference microscopy: principles, use and image interpretation
- 1 June 1970
- journal article
- review article
- Published by Wiley in Journal of Microscopy
- Vol. 91 (3), 149-172
- https://doi.org/10.1111/j.1365-2818.1970.tb02219.x
Abstract
No abstract availableKeywords
This publication has 10 references indexed in Scilit:
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- Application à la métallographie des méthodes interférentielles à deux ondes polariséesRevue de Métallurgie, 1955