Reverse modeling of E/D logic submicrometer MODFETs and prediction of maximum extrinsic MODFET current gain cutoff frequency

Publisher Website

1 April 1990

journal article
Published by Institute of Electrical and Electronics Engineers (IEEE) in IEEE Transactions on Electron Devices

Vol. 37 (4), 920-934
https://doi.org/10.1109/16.52425

Abstract

No abstract available

Keywords

This publication has 30 references indexed in Scilit:

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