Topographic Correction of 3D SIMS Images
- 1 September 1997
- journal article
- research article
- Published by Wiley in Surface and Interface Analysis
- Vol. 25 (10), 788-789
- https://doi.org/10.1002/(sici)1096-9918(199709)25:10<788::aid-sia300>3.0.co;2-w
Abstract
No abstract availableKeywords
This publication has 3 references indexed in Scilit:
- Spatially multidimensional secondary ion mass spectrometry analysisAnalytica Chimica Acta, 1994
- Use of image depth profiling SIMS for the study of tinplate corrosionSurface and Interface Analysis, 1994
- SIMS imaging studies of the corrosion of alloy 800 and alloy 600 surfaces under secondary side boiler conditionsSurface and Interface Analysis, 1992