Secondary electron emission properties
- 1 January 1996
- journal article
- Published by Elsevier in Philips Journal of Research
- Vol. 50 (3-4), 375-389
- https://doi.org/10.1016/s0165-5817(97)84681-5
Abstract
No abstract availableKeywords
This publication has 16 references indexed in Scilit:
- Basics of electron transport over insulatorsPhilips Journal of Research, 1996
- Introduction to Zeus displaysPhilips Journal of Research, 1996
- Quantitative electron spectroscopy of surfaces: A standard data base for electron inelastic mean free paths in solidsSurface and Interface Analysis, 1979
- Origin of secondary-electron-emission yield-curve parametersJournal of Applied Physics, 1975
- Effects of secondary electron scattering on secondary emission yield curvesJournal of Applied Physics, 1973
- High-efficiency secondary-electron emission from sputtered MgO–Au cermetsApplied Physics Letters, 1973
- Fast, Accurate Secondary-Electron Yield Measurements at Low Primary EnergiesReview of Scientific Instruments, 1973
- Secondary Electron Emission from MgO Thin FilmsJournal of Applied Physics, 1959
- Dissipation of Energy by 2.5–10 kev Electrons in Al2O3Journal of Applied Physics, 1957
- Penetration of Electrons and Ions in AluminumJournal of Applied Physics, 1956