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Publications
X-Ray Photoelectron Spectroscopy of SiO
2
-Si Interfacial Regions: Ultrathin Oxide Films
Home
Publications
X-Ray Photoelectron Spectroscopy of SiO
2
-Si Interfacial Regions: Ultrathin Oxide Films
X-Ray Photoelectron Spectroscopy of SiO
2
-Si Interfacial Regions: Ultrathin Oxide Films
SR
S. I. Raider
S. I. Raider
RF
R. Flitsch
R. Flitsch
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1 May 1978
journal article
Published by
IBM
in
IBM Journal of Research and Development
Vol. 22
(3)
,
294-303
https://doi.org/10.1147/rd.223.0294
Abstract
No abstract available
Keywords
X RAY PHOTOELECTRON SPECTROSCOPY
Cited by 97 articles