Experimental Study of Effect of Crystallite Size Statistics on X-Ray Diffractometer Intensities
- 1 January 1959
- journal article
- research article
- Published by AIP Publishing in Journal of Applied Physics
- Vol. 30 (1), 63-69
- https://doi.org/10.1063/1.1734976
Abstract
The relative rms deviation σ of the intensity of a rapidly rotating polycrystallite specimen is σ=[6.5R sinθ]/[h(mNeff)½], where R=goniometer radius, θ=Bragg angle, h=(hf+hs)/2, hf=length of focal spot, hs=length of receiving slit, m=multiplicity factor, and Neff the effective number of irradiated crystallites. Experimental data on silicon powder specimens are presented to show the dependence of σ on crystallite sizes, choice of x‐ray wavelengths and various other experimental parameters. Comparisons of data for rapidly rotating and stationary specimens having crystallite sizes in the 30–50 μ range show that rotation improves σ by a factor of 7 or 8 for peak intensities and 4 or 5 for integrated intensities, using a standard diffractometer.Keywords
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