Abstract
The anomalous surface reflection of x rays reported recently by Yoneda has been investigated for several materials using MoKα1, CuKα1, and CrKα1 radiation. The experimental evidence speaks strongly in favor of the Warren and Clarke interpretation in terms of totally reflected small‐angle scattering. For clean surfaces the scattering appears to be due to surface irregularities of the bulk material itself. Because of its sensitivity to the roughness and chemical contamination of optically or near‐optically finished surfaces, the Yoneda effect has considerable promise as a new x‐ray tool for studying surfaces and thin films.