Measurement of in-plane displacement with twofold sensitivity using phase reversal technique
- 1 November 1999
- journal article
- Published by SPIE-Intl Soc Optical Eng in Optical Engineering
- Vol. 38 (11), 1964-1966
- https://doi.org/10.1117/1.602246
Abstract
No abstract availableKeywords
This publication has 8 references indexed in Scilit:
- Techniques of Displacement and Deformation Measurements in Speckle MetrologyPublished by Taylor & Francis ,2020
- Phase step calibration and phase measurement in image plane holography using BaTiO3 crystal as a recording mediumOptical Engineering, 1998
- Fringe formation in an in-plane displacement measurement configuration with twofold increase in sensitivity: theory and experimentApplied Optics, 1998
- Twofold increase in sensitivity with a dual‐beam illumination arrangement for electronic speckle pattern interferometryOptical Engineering, 1996
- Simultaneous implementation of Leendertz and Duffy's methods for in-plane displacement measurementOptics Communications, 1996
- In-plane displacement measurement configuration with twofold sensitivityApplied Optics, 1993
- Optical Image SubtractionOptical Engineering, 1975
- Interferometric displacement measurement on scattering surfaces utilizing speckle effectJournal of Physics E: Scientific Instruments, 1970