Morphological change in the degradation of Al electrode surfaces of electroluminescent devices by fluorescence microscopy and AFM
- 1 February 1996
- journal article
- Published by Elsevier in Thin Solid Films
- Vol. 273 (1-2), 209-213
- https://doi.org/10.1016/0040-6090(95)06781-7
Abstract
No abstract availableKeywords
This publication has 13 references indexed in Scilit:
- Observation of degradation processes of Al electrodes in organic electroluminescence devices by electroluminescence microscopy, atomic force microscopy, scanning electron microscopy, and Auger electron spectroscopyJournal of Applied Physics, 1994
- Observation of Crystallization of Vapor-deposited TPD Films by AFM and FFMChemistry Letters, 1994
- Efficient organic electroluminescent device using a single bipolar carrier transport layerJournal of Applied Physics, 1992
- Chemical tuning of electroluminescent copolymers to improve emission efficiencies and allow patterningNature, 1992
- Synthesis of a segmented conjugated polymer chain giving a blue-shifted electroluminescence and improved efficiencyJournal of the Chemical Society, Chemical Communications, 1992
- Light-emitting diodes based on conjugated polymersNature, 1990
- Blue light-emitting organic electroluminescent devicesApplied Physics Letters, 1990
- Electroluminescence of doped organic thin filmsJournal of Applied Physics, 1989
- Organic electroluminescent diodesApplied Physics Letters, 1987
- Differential Electrochemical Mass Spectroscopy (DEMS) — a New Method for the Study of Electrode ProcessesBerichte der Bunsengesellschaft für physikalische Chemie, 1984