Thin-Film Piezoelectric Transducers used as Generators and Detectors of Microwave Phonons, with some Attenuation Measurements in SiO2

Abstract

The manner in which thin‐film piezoelectric transducers are used is determined by their intended application. Attenuation measurement transducers should be capable of independent generation of each of the three pure acoustic modes and should exhibit low electromechanical conversion efficiency, whereas device transducers should exhibit maximum possible electromechanical conversion efficiency. Multilayer transducers offer increased power handling capabilities and higher electrical impedances than single‐layer transducers at high frequencies. An anomalous behavior of quartz in the presence of CdS is discussed. Attenuation measurements of the L, T₁, and T₂ modes along the X₁ axis of synthetic quartz are presented.