Automatized X-Ray Line Profile Analysis
- 1 June 1963
- journal article
- research article
- Published by AIP Publishing in Review of Scientific Instruments
- Vol. 34 (6), 684-688
- https://doi.org/10.1063/1.1718540
Abstract
X‐ray line profiles are measured fully automatically by means of a preprogrammed step scan. The intensity data are taken by means of the fixed count method and punched into paper tape by an electronic clock. The evaluation of the intensity data and the Fourier analysis of the line profiles is performed on an IBM 1620 computer.Keywords
This publication has 4 references indexed in Scilit:
- Notizen: Zur Kenntnis der Magnesiumboranat-BildungZeitschrift für Naturforschung B, 1962
- Variance as a Measure of Line BroadeningNature, 1962
- X-ray studies of deformed metalsProgress in Metal Physics, 1959
- A Numerical Fourier-analysis Method for the Correction of Widths and Shapes of Lines on X-ray Powder PhotographsProceedings of the Physical Society, 1948