Low-Angle Subgrain Boundaries in Tellurium
- 1 December 1967
- journal article
- research article
- Published by AIP Publishing in Journal of Applied Physics
- Vol. 38 (13), 5132-5138
- https://doi.org/10.1063/1.1709290
Abstract
A study of low‐angle subgrain boundaries in tellurium crystals was carried out using electron microscopical techniques. The existence of symmetric tilt boundaries could be proved by the examination of the electron diffraction patterns and the determination of the Burgers vectors forming the boundaries. The motion of the individual dislocations of a boundary at elevated temperatures was investigated and the effect of irradiation with fission fragments studied.Keywords
This publication has 5 references indexed in Scilit:
- Diffraction contrast of electron microscope images of crystal lattice defects. III. Results and experimental confirmation of the dynamical theory of dislocation image contrastProceedings of the Royal Society of London. Series A. Mathematical and Physical Sciences, 1962
- Electron Microscope Observation of Etched Tracks from Spallation Recoils in MicaPhysical Review Letters, 1962
- Some Effects Occurring in Dislocated TelluriumJournal of Applied Physics, 1960
- Dislocation etch pits in telluriumActa Metallurgica, 1958
- LXVIII. Direct observations of the arrangement and motion of dislocations in aluminiumPhilosophical Magazine, 1956