LIII. The Examination of p-n Junctions with the Scanning Electron Microscope†
- 1 May 1957
- journal article
- research article
- Published by Taylor & Francis in Journal of Electronics and Control
- Vol. 2 (6), 568-570
- https://doi.org/10.1080/00207215708937060
Abstract
(1957). LIII. The Examination of p-n Junctions with the Scanning Electron Microscope† Journal of Electronics and Control: Vol. 2, No. 6, pp. 568-570.This publication has 1 reference indexed in Scilit:
- The scanning electron microscope and its fields of applicationBritish Journal of Applied Physics, 1955