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Simple method for examining sulphur passivation of facets in InGaAs–AlGaAs (λ=0.98 μm) laser diodes
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Publications
Simple method for examining sulphur passivation of facets in InGaAs–AlGaAs (λ=0.98 μm) laser diodes
Simple method for examining sulphur passivation of facets in InGaAs–AlGaAs (λ=0.98 μm) laser diodes
GB
G. Beister
G. Beister
JM
J. Maege
J. Maege
DG
D. Gutsche
D. Gutsche
GE
G. Erbert
G. Erbert
JS
J. Sebastian
J. Sebastian
KV
K. Vogel
K. Vogel
M. Weyers
M. Weyers
JW
J. Würfl
J. Würfl
OD
O. P. Daga
O. P. Daga
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29 April 1996
journal article
Published by
AIP Publishing
in
Applied Physics Letters
Vol. 68
(18)
,
2467-2468
https://doi.org/10.1063/1.115822
Abstract
No abstract available
Keywords
ELECTROLUMINESCENCE
GALLIUM ARSENIDE
CATASTROPHIC OPTICAL DAMAGE
Cited by 22 articles