A precision measurement of film thicknesses
- 31 August 1968
- journal article
- Published by Elsevier in Solid State Communications
- Vol. 6 (8), 527-531
- https://doi.org/10.1016/0038-1098(68)90504-8
Abstract
No abstract availableKeywords
This publication has 3 references indexed in Scilit:
- Adsorption and Bonding Properties of Cleavage Surfaces of Bismuth TelluridePhysical Review B, 1960
- Chemical bonding in bismuth tellurideJournal of Physics and Chemistry of Solids, 1958
- The Crystal Structure of the Mineral Tetradymite, Bi2Te2SZeitschrift für Kristallographie - Crystalline Materials, 1934