Local in-depth analysis of ceramic materials by neutral beam secondary ion mass spectrometry
- 31 July 1980
- journal article
- Published by Elsevier in International Journal of Mass Spectrometry and Ion Physics
- Vol. 34 (3-4), 361-373
- https://doi.org/10.1016/0020-7381(80)85049-2
Abstract
No abstract availableThis publication has 15 references indexed in Scilit:
- Charging of insulators by ion bombardment and its minimization for secondary ion mass spectrometry (SIMS) measurementsJournal of Applied Physics, 1976
- Tracerdiffusion und Fehlordnung in dem Orthosilikat Co2SiO4Berichte der Bunsengesellschaft für physikalische Chemie, 1975
- Thermodynamic approach to the quantitative interpretation of sputtered ion mass spectraAnalytical Chemistry, 1973
- New developments in the surface analysis of solidsApplied Physics B Laser and Optics, 1973
- Analytic methods for the ion microprobe mass analyzer. Part II.International Journal of Mass Spectrometry and Ion Physics, 1970
- Processus de formation d'ions à partir d'atomes éjectés dans des états électroniques surexcités lors du bombardement ionique des métaux de transitionJournal de Physique, 1970
- Progress in analytic methods for the ion microprobe mass analyzerInternational Journal of Mass Spectrometry and Ion Physics, 1969
- Atomic and Ionic Impact Phenomena on Metal SurfacesPublished by Springer Nature ,1965
- Étude d’une méthode d’analyse locale chimique et isotopique utilisant l’émission ionique secondaireAnnales de Physique, 1964
- Sputtering Ion Source for SolidsJournal of Applied Physics, 1963