Determination of the Atomic Scattering Factors of Germanium by Means of the Pendellösung-Beat Measurement Using White Radiations

Abstract

An attempt was made to measure the Pendellösung intensity beats of white radiations diffracted from parallel-sided single crystal wafers of germanium by the energy-dispersive diffraction technique. The extremum positions in the beats were determined to evaluate the atomic scattering factors for seven reflections, 111 to 511. The scattering factor showed a clear wavelength dependence in the wavelength range between 0.3 and 0.6 A, which can be expected from the dispersion correction term f', as calculated by Cromer. From the measured values of (f _{h k l} ⁰+f') e^-M at 0.4 A, the f _{h k l} ⁰ values for the seven reflections were evaluated by using Cromer's f' value and the characteristic temperature, \varTheta _M =290 K, which has been reported by Batterman and Chipman and by Ludewig. The obtained f _{h k l} ⁰ values, except for the 111 reflection, were almost the same as the data by Matsushita and Kohra.