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Measurement of potential at semiconductor interfaces by electron spectroscopy
Home
Publications
Measurement of potential at semiconductor interfaces by electron spectroscopy
Measurement of potential at semiconductor interfaces by electron spectroscopy
RG
R. W. Grant
R. W. Grant
EK
E. A. Kraut
E. A. Kraut
SK
S. P. Kowalczyk
S. P. Kowalczyk
JW
J. R. Waldrop
J. R. Waldrop
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1 April 1983
journal article
Published by
American Vacuum Society
in
Journal of Vacuum Science & Technology B
Vol. 1
(2)
,
320-327
https://doi.org/10.1116/1.582550
Abstract
No abstract available
Cited by 51 articles