A device for transferring specimens from an ultrahigh vacuum chamber into the tilting goniometer of the JEOL 100B electron microscope
- 1 May 1976
- journal article
- Published by IOP Publishing in Journal of Physics E: Scientific Instruments
- Vol. 9 (5), 382-384
- https://doi.org/10.1088/0022-3735/9/5/018
Abstract
No abstract availableKeywords
This publication has 1 reference indexed in Scilit:
- A high vacuum low temperature specimen transfer device for use with an electron microscopeJournal of Physics E: Scientific Instruments, 1969