Improvement in high resolution image quality of radiation-sensitive specimens achieved with reduced spot size of the electron beam
- 31 December 1985
- journal article
- research article
- Published by Elsevier in Ultramicroscopy
- Vol. 20 (3), 269-278
- https://doi.org/10.1016/0304-3991(86)90191-9
Abstract
No abstract availableThis publication has 9 references indexed in Scilit:
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