Use of Thin Single Crystals as Reference Standards for Precision Electron Diffraction
- 1 April 1966
- journal article
- Published by AIP Publishing in Journal of Applied Physics
- Vol. 37 (5), 2016-2020
- https://doi.org/10.1063/1.1708663
Abstract
No abstract availableKeywords
This publication has 2 references indexed in Scilit:
- Precision Determination of Lattice Constants with a Geiger-Counter X-Ray DiffractometerPhysical Review B, 1955
- Unit-cell dimensions of graphiteActa Crystallographica, 1950