A Double Crystal Study of Scattered X-Rays

Abstract

A study of the unmodified scattered x-rays has been made to detect possible fine structure lines as reported by previous experimenters. With copper and silver $K$ series scattered by blocks of graphite and aluminum no trace of any fine structure lines was observed. The sensitivity of the apparatus was apparently many times that used by any previous experimenter. Experiments were also performed to measure the change in wave-length and the width of the modified line. It was found that the change in wave-length agreed within one percent with the change predicted by the quantum theory of x-rays scattered by free electrons. That is, with the equation $\delta \lambda =\left(\frac{h}{\mathrm{mc}}\right)(1-cos \phi )$. The width of the modified line was found to be about twice as broad as it should have been from the divergence of the scattering angle.