Construction and performance of an FIM-Atom Probe
- 31 October 1970
- journal article
- Published by Elsevier in Surface Science
- Vol. 23 (1), 88-111
- https://doi.org/10.1016/0039-6028(70)90007-5
Abstract
No abstract availableThis publication has 9 references indexed in Scilit:
- Fim atom probe analysis of individual image spots caused by gas adsorptionSurface Science, 1970
- Ion Detection Using a Continuous Channel Electron MultiplierReview of Scientific Instruments, 1970
- Field adsorption and desorption of helium and neonSurface Science, 1969
- Calibration of the Atom Probe FIMReview of Scientific Instruments, 1969
- Use of a channelled image intensifier in the field-ion microscopeJournal of Physics E: Scientific Instruments, 1969
- Centenary Lecture. Field-ion microscopy and the electronic structure of metal surfacesQuarterly Reviews, Chemical Society, 1969
- ON THE IONIZATION STATE OF FIELD EVAPORATED ATOMS AS MEASURED IN THE FIM-ATOM PROBEApplied Physics Letters, 1968
- The Atom-Probe Field Ion MicroscopeReview of Scientific Instruments, 1968
- Low Energy Charged-Particle Detection Using the Continuous-Channel Electron MultiplierReview of Scientific Instruments, 1965